within-field variability

Wheat yield modelling using time-integrated NDVI
Invited speaker
Oct 18, 2018 9:00 AM — Oct 19, 2018 2:00 PM Beijing, China
Project
Wheat yield modelling using time-integrated NDVI
An empirical model for prediction of wheat yield, using time-integrated Landsat NDVI
Information on long-term yield variability is important for tailoring farming practices to the needs of crops. We present a linear …
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An empirical model for prediction of wheat yield, using time-integrated Landsat NDVI